The transmission electron microscope (TEM), with its many different configurations for imaging, diffraction, and microanalysis, has become an indispensable tool for the structural characterization of materials at the nanoscale. Aided by aberration correction, the image resolution can nowadays surpass the 0.5-Ångstron level. Such characterization capability is essential for the discovery and exploitation of novel materials, which often require the precise control of structures and chemistries. In this presentation, I will briefly summarize my research on alnico permeant magnets using atom probe tomography and various TEM techniques, separately or in tandem. Our collaborative studies on alnico magnets reveal how the chemistry and heat-treatment conditions control the properties of the final products. Finally, I will show some of our in-situ investigations on the mechanisms and dynamics of solid-solid phase transitions in different material systems.  N.Y. Schmidt et al., Phys. Rev. B 100, 064428 (2019).
13. Juli 2021, 09:00-10:00
Zoom (link on website)